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Testing and Measurement (6)

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by H. Anthony Chan (Editor)
May 2001, Hardcover, Wiley-IEEE Press
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by Patrick H. Garrett
January 2000, Paperback, Wiley-IEEE Press
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by Larry K. Baxter
September 1996, Paperback, Wiley-IEEE Press
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by Thomas M. Kowalick
November 2004, Hardcover, Wiley-IEEE Press
US $74.95 Add to Cart
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by Hiromitsu Kumamoto, Ernest J. Henley
April 2000, Paperback, Wiley-IEEE Press
US $135.50 Add to Cart
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by Stephen A. Dyer
June 2001, Hardcover, Wiley-IEEE Press
US $275.00 Add to Cart